Quote for 23128 Part with NSN 5962-01-217-4206 by Nec Electronics Usa Inc
| Part No. : 23128 | Manufacturer : Nec Electronics Usa Inc | Item Name : microcircuit memory | CAGE Code : 33297 | NSN : 5962-01-217-4206 | FSC : 5962 microcircuits electronic |
Parts we carry include part number 23128, Microcircuit Memory with NSN 5962012174206 by Nec Electronics Usa Inc. Just fill out the Request for Quote (RFQ) form below to get started on a quote. As you fill out the RFQ, make sure that all fields are properly completed. Your quote will be determined primarily by your response to asterisk-marked (*) fields like Need Parts By and Quantity (ea).
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NSN Information for Part Number 23128 with NSN 5962-01-217-4206, 5962012174206
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-217-4206 Item Description: Microcircuit Memory | 5962 | 012174206 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | B | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 23128 | 2 | 1 | 5 |
Characteristics Data of NSN 5962-01-217-4206, 5962012174206
| MRC | Criteria | Characteristic |
|---|---|---|
| MEMORY | ADAQ | BODY LENGTH1 300 INCHES MAXIMUM |
| MEMORY | ADAT | BODY WIDTH0 520 INCHES NOMINAL |
| MEMORY | ADAU | BODY HEIGHT0 205 INCHES MAXIMUM |
| MEMORY | AFGA | OPERATING TEMP RANGE-25 0 TO 75 0 DEG CELSIUS |
| MEMORY | AFJQ | STORAGE TEMP RANGE-65 0 TO 150 0 DEG CELSIUS |
| MEMORY | CBBL | FEATURES PROVIDEDPROGRAMMABLE AND MONOLITHIC AND ULTRAVIOLET ERASABLE |
| MEMORY | CQSJ | INCLOSURE MATERIALCERAMIC |
| MEMORY | CQSZ | INCLOSURE CONFIGURATIONDUAL-IN-LINE |
| MEMORY | CQWX | OUTPUT LOGIC FORMN-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| MEMORY | CQZP | INPUT CIRCUIT PATTERN17 INPUT |
| MEMORY | CRHL | BIT QUANTITY131072 |
| MEMORY | CSWJ | WORD QUANTITY16384 |
| MEMORY | CWSG | TERMINAL SURFACE TREATMENTSOLDER |
| MEMORY | CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC-0 5 VOLTS MAXIMUM POWER SOURCE AND 7 0 VOLTS MAXIMUM POWER SOURCE |
| MEMORY | CZEQ | TIME RATING PER CHACTERISTIC250 00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME LOW TO HIGH LEVEL OUTPUT AND 250 00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME HIGH TO LOW LEVEL OUTPUT |
| MEMORY | CZER | MEMORY DEVICE TYPEROM |
| MEMORY | TEST | TEST DATA DOCUMENT96906-MIL-STD-883 STANDARD INCLUDES INDUSTRY OR ASSOCIATION STANDARDS INDIVIDUAL MANUFACTUREER STANDARDS ETC |
| MEMORY | TTQY | TERMINAL TYPE AND QUANTITY28 PRINTED CIRCUIT |
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